New PDF release: Progress in Fourier Transform Spectroscopy: Proceedings of

By Bruce Chase (auth.), Prof. Dr. János Mink, Dr. Gábor Keresztury, Prof. Dr. Robert Kellner (eds.)

ISBN-10: 3211829318

ISBN-13: 9783211829318

ISBN-10: 3709168406

ISBN-13: 9783709168400

19 plenary lectures and 203 poster papers offered on the tenth foreign convention of Fourier rework Spectroscopy in Budapest 1995 supply an summary at the state-of-the paintings of this know-how and its wide selection of purposes. The reader gets info on any facets of FTS together with the most recent instrumental advancements, e.g. in diode array detection, time solution FTS, microscopy and spectral mapping, double modulation and two-dimensional FTS.

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Extra resources for Progress in Fourier Transform Spectroscopy: Proceedings of the 10th International Conference, August 27 – September 1, 1995, Budapest, Hungary

Sample text

Zhang . Chem. Phys. submitted. [19] J. E. Bertie, S. L. Zhang. App/. Spectrosc. 1994. 48. 176. [20] J. E. Bertie, S. L. Zhang. J. Chem. Phys. 8364. [21] H. Torii, M. Tasumi,.!. Chem. Phys. 1993, 99, 8459. Mikrochim. ] 14, 23-31 (1997) ·;Q Springer-Verlag 1997 Digging for Light in Semiconductor Mines - Infrared Views of Luminescent Porous Silicon Wolfgang Theiß I. Physikalisches Institut, Aachen University of Technology (RWTH), D-52056 Aachen, Federal Republic of Germany Abstract. Infrared reflection spectroscopy is presented as a tool for the investigation ofporous silicon.

This paper describes transmission measurements almost exclusively. The paper contains a brief discussion of the problems involved in the measurement of intensities of liquids by transmission, and how they have been overcome sufficiently to allow the acceptance of a published set of secondary intensity standards that are believed accurate to about 2%. The computations involved yield spectra of the real and imaginary refractive indices. The computations are sufficiently complex in detail to discourage their use, although an established computer program is available, so the paper continues with a report of a much simpler calculation that, although approximate, is more accurate then current measurements for all but the m ost intense bands.

L. Zhang . Chem. Phys. submitted. [19] J. E. Bertie, S. L. Zhang. App/. Spectrosc. 1994. 48. 176. [20] J. E. Bertie, S. L. Zhang. J. Chem. Phys. 8364. [21] H. Torii, M. Tasumi,.!. Chem. Phys. 1993, 99, 8459. Mikrochim. ] 14, 23-31 (1997) ·;Q Springer-Verlag 1997 Digging for Light in Semiconductor Mines - Infrared Views of Luminescent Porous Silicon Wolfgang Theiß I. Physikalisches Institut, Aachen University of Technology (RWTH), D-52056 Aachen, Federal Republic of Germany Abstract. Infrared reflection spectroscopy is presented as a tool for the investigation ofporous silicon.

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Progress in Fourier Transform Spectroscopy: Proceedings of the 10th International Conference, August 27 – September 1, 1995, Budapest, Hungary by Bruce Chase (auth.), Prof. Dr. János Mink, Dr. Gábor Keresztury, Prof. Dr. Robert Kellner (eds.)


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